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A Lightweight Hybrid Approach for Surface Defect Detection in Industrial RAW Images Using HOG and SVM

Tạp chí / Hội thảo: Advances in Information and Communication Technology: Proceedings of the 4th International Conference, ICTA 2025, Volume 1 Volume 1, pp. 123-133 Đơn vị: ICTU DOI / Link:

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Source ID: 74; Author classification: ICTU - Main Author; First listed author: Van Son Nguyen; Contact author: Hoang Thi Canh; Total authors: 5; Springer matched from provided ICTA 2025 volumes